White Paper:

At-Line Micronutrient Analysis Using ED-XRF Spectroscopy

Posted 6/15/2016

Kleve, Germany — July 8, 2015 — The ability to conduct at-line micronutrient analysis using ED-XRF spectroscopy at the point of production is detailed in a new application brief from SPECTRO Analytical Instruments, available to download at http://xrf.spectro.com/micronutrient. The brief, “At-Line Micronutrient Analysis Using ED-XRF Spectroscopy at the Point of Production” , details the significant advantages of at-line elemental analysis for product quality control and consistency in micronutrient analysis — while maximizing production throughput. Both the recent use of inductively coupled plasma-optical emission spectrometry (ICP-OES) and alternate colorimetric methods for manufacturing quality control purposes present drawbacks for producers, according to the paper. These include the need to transport samples from the production line to a laboratory for analysis, and the lengthy time that is required for extensive sample preparation. In contrast, the advantages of at-line elemental analysis are many. The foremost benefit, according to the brief, is that with a new-generation portable ED-XRF spectrometer,...


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Article:

SPECTRO Analytical Instruments and BALVER ZINN Join Forces on Tin Solder Bath Analysis Application

Posted 4/26/2016

Kleve/Balve, Germany, April 26, 2016 – Two highly respected industry leaders,  SPECTRO Analytical Instruments GmbH and BALVER ZINN Josef Jost…

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Article:

New SPECTRO xSORT Handheld XRF Analyzer Delivers Improved Speed, Precision in Analysis of Light Elements

Posted 4/5/2016

Kleve, Germany — April 5, 2016 — SPECTRO Analytical Instruments today announced a major new upgrade of the SPECTRO xSORT handheld X-ray…

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Article:

New SPECTROMAXx Arc/Spark OES Metal Analyzer Delivers Improved Speed and Performance in Accurate Elemental Analysis

Posted 3/31/2016

SPECTROMAXx Arc/Spark Optical Emission Spectrometry (OES) metal analyzer that has been improved to deliver greater consumables savings and faster measurement time…

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Article:

New SPECTRO XEPOS Spectrometers Redefine ED-XRF With Exceptional New Levels of Elemental Analysis Performance

Posted 1/19/2016

SPECTRO Analytical Instruments today announced its new line of SPECTRO XEPOS spectrometers, representing a quantum leap inenergy dispersive X-ray fluorescence (ED-XRF)…

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White Paper:

New Application Brief from SPECTRO: Using New Portable ED-XRF Instruments At-Line Can Provide Reliable Coat-Weight Measurement

Posted 11/17/2015

Kleve, Germany — November 17, 2015 — A new application brief explains how a new generation of portable energy dispersive…

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White Paper:

New White Paper from SPECTRO: Why Overcoming Matrix Effects With XRF Analysis Is Critical For High-Accuracy Results

Posted 11/4/2015

Kleve, Germany — November 4, 2015 — A new white paper explains why overcoming matrix effects associated with X-ray fluorescence…

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